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PSICHÉ

logo-psiche

PSICHÉ (Pression Structure Imagerie par Contraste à Haute Énergie) : this beamline is dedicated to x-ray diffraction under extreme conditions (pressure-temperature) and to tomography by absorption contrast at high energy (20-50 keV). 

The PSICHÉ beamline is installed on a short straight section of the SOLEIL (I03c), The source is a under vacuum multi-pole wiggler (2.1 T) which delivers a white beam with a large photon energy range (15-100keV). 
To perform the various experiments planned on the beamline, 4 different operating modes will be implemented.

  1. White beam mode : energy dispersive x-ray diffraction 
  2. Focused monochromatic mode : angular dispersive x-ray diffraction 
  3. Unfocused monochromatic mode : high energy resolution tomography 
  4. Unfocused monochromatic mode : high flux tomography

The beamline is divided in two hutches. The first hutch accomodates the optic but is also used for the white beam experiments (mode 1). The second one is the monochromatic experiment hutch (modes 2,3,4).

Team

CHAUVIGNE
CHAUVIGNE Paul
HENRY
HENRY Laura
OKUMKO
OKUMKO Victor
PERRUCHON-MONGE
PERRUCHON-MONGE Lola

Technical data

Energy range

15-100 keV for white beam (low energy part is filtered) 
15-50 keV for monochromatic beam 

Energy Resolution (ΔE/E)

∆E/E ~10-2 for mode 1 (Ge detector resolution) and mode 4 (Double Multilayer Monochromator) 
∆E/E ~10-3 for mode 2 and 4 (Double Crystal Monochromator)

Source

Under vacuum multipole wiggler: 2.1 T, period 50 mm, 38 periods

Optics

- Focusing vertical mirror 
- Double Crystal Monochromator (Si111 and saggital focusing Si 311) 
- Two focusing mirrors in KB geometry 
- Double Multilayer Monochromator

Sample Environment

- Diamond anvil cells 
- Paris-Edinburgh cell 
- Large Volume multianvil cell 
- Raman set-up for in situ measurements 
- Pressure measurement set-up

Flux on sample

- White beam :1-8 108 ph/s/0.1% E in a 10 μm x10 μm hole 
- DCM 311: at 30 keV 4 1011 ph/s in 100 μm x100 μm spot , 1 1010 ph/s in 10 μm x10 μm spot after KB 
- DCM 111: at 30 keV 1.4 1013 ph/s in a 16.8 x 5.9 mm2 spot 
- DMM : 3.5 1015 ph/s in a 15 x 3 mm2 spot

Detectors

- Ge solid state detector 
- Image plate MARE Research 
- Flat panel

Scientific Opportunities

X-ray diffraction: Materials under extreme conditions Geosciences (earth structure), Physic (molecular solids, functional materials, highly correlated electrons materials…), chemistry (synthesis of hard material) Biology (folding and unfolding of proteins)
Tomography  Metallurgy, metallic alloys under strain (including under high pressure)