Dernière mise à jour : 10.05.2023
Modi, M.H., Rai, S.K., Thomasset, M., Lodha, G.S., Idir, M. "Effect of surface roughness on multilayer film growth" European Physical Journal.-Special Topics., 167(1): 27-32. (2009).
Idir, M., Mercère, P., Modi, M.H., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "X-ray active mirror coupled with a Hartmann wavefront analyser" Paper presented at the Workshop on X-ray and XUV Active Optics 2nd, 9-11 October 2008. (2008).
Couprie, M. E., Loulergue, A., Benabderrahmane, C., Chubar, O., Denard, J. C., Filhol, J.M., Idir, M., Labat, M., Lestrade, A., Louvet, M., Marchand, P., Marcouillé, O., Mercère, P., Nadolski, L., Nahon, L., Dumas, P., Morin, P., Bruni, C., Lambert, G., Zeitoun, P., Garzella, D., Meyer, M., Lüning, J., Collet, E., Giannessi, L. "The ARC-EN-CIEL fourth generation light source proposal". Paper presented at the 30th International FEL Conference, Gyeongju, Korea, August 24-29, 2008.. abs.n° MOPPH066. (2008).
Gautier, J., Zeitoun, P., Hauri, C., Morlens, A.S., Rey, G., Valentin, C., Papalarazou, E., Goddet, J.P., Sebban, S., Burgy, F., Mercère, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Fajardo, M., Merdji, H., Caumes, J.P. "Optimization of the wave front of high order harmonics" European Physical Journal D., 48(3): 459-463. (2008).
Mercère, P., Idir, M., Floriot, J., Levecq, X. "Hartmann and Shack–Hartmann Wavefront Sensors for Sub-nanometric Metrology" In Modern Developments in X-Ray and Neutron Optics: 219-232: Springer-Verlag, 2008. ISBN: 978-3-540-74560-0
Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Moreno, T., Brochet, S. "A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors" Journal of Synchrotron Radiation., 15(2): 134-139. (2008).
Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Brochet, S., Moreno, T., Wolfgang Osten, Christophe Gorecki, Erik L. Novak "Surface metrology with a stitching Shack-Hartmann profilometric head" Paper presented at the Optical Measurement Systems for Industrial Inspection V, Munich, Germany, 18 June 2007. Wolfgang Osten, Christophe Gorecki, Erik L. Novak, 6616: 66162A. (2007).
Reverchon, J.L., Robo, J.A., Truffer, J.P., Caumes, J.P., Idir, M., Brault, J., Duboz, J.Y. "AlGaN-based focal plane arrays for selective UV imaging at 310nm and 280nm and route toward deep UV imaging". Paper presented at the Sensors, Systems, and Next-Generation Satellites XI, 17-20 September 2007, Florence, Italy. 6744: art.n° 674417. (2007).
Idir, M., Mercère, P., Moreno, T., Delmotte, A., Jae-Young Choi & Seungyu Rah "Metrology and Tests Beamline at SOLEIL" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & Seungyu Rah, 879: 619-622. (2006).
Itié, J.P., Flank, A.M., Lagarde, P., Polian, A., Couzinet, B., Idir, M., Jae-Young Choi & Seungyu Rah "Extension to Low Energies (<7keV) of High Pressure X-Ray Absorption Spectroscopy" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & Seungyu Rah, 879: 1329-1332. (2006).