Last update : 01.23.2026
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Kukk, E., Niskanen, J., Travnikova, O., Berholts, M., Kooser, K., Peng, D., Ismail, I., Piancastelli, M.N., Püttner, R., Hergenhahn, U., Simon, M. "Orientational anisotropy due to molecular field splitting in sulfur 2p photoemission from CS2 and SF6 -- theoretical treatment and application to photoelectron recoil." PCCP - Physical Chemistry Chemical Physics., 26(32): 21810-21820. (2024).
Barrett, N., Hamouda, W., Lubin, C., Laguerre, J., Carabasse, C.., Vaxelaire, N., Coignus, J., Martin, S., Grenouillet, L. "Oxygen vacancy engineering in Si-doped, HfO2 ferroelectric capacitors using Ti oxygen scavenging layers" Applied Physics Letters., 125(4): art.n° 043502. (2024).
Gutièrrez–Llorente, A., Raji, A., Zhang, D., Divay, L., Gloter, A., Gallego, F., Galindo, C., Bibes, M., Iglesias, L. "Toward Reliable Synthesis of Superconducting Infinite Layer Nickelate Thin Films by Topochemical Reduction" Advanced Materials., 11(24): art.n° 2309092. (2024).
Balan, C., Fischer, J., Gueneau, C., Fassatoui, A., Rueff, J.P., Ceolin, D., De-Santis, M., Vogel, J., Ranno, L., Béa, H., Pizzini, S. "Using hard-x-ray photoelectron spectroscopy to measure the oxidation state of gated Co/AlOx interfaces" Physical Review Applied., 21(6): art.n° 064023. (2024).
Manzanillas, L., Ablett, J.M., Choukroun, M., Iguaz, F. J., Rueff, J.P. "Development of an x-ray polarimeter at the SOLEIL synchrotron" Review of Scientific Instruments., 95(5): art.n° 053302. (2024).
Simon, M. "Dynamique ultrarapide de molécules isolées excitées" Actualité Chimique., (494): 20-24. (2024).
Ismail, I., Moussaoui, R., Vacheresse, R., Marchenko, T., Travnikova, O., Guillemin, R., Verma, A., Velasquez, N., Peng, D., Ringuenet, H., Penent, F., Püttner, R., Céolin, D., Rueff, J.P., Simon, M. "MOSARIX: Multi-crystal spectrometer in the tender x-ray range at SOLEIL synchrotron" Review of Scientific Instruments., 95(5): art.n° 053103. (2024).
Gorelov, V., Reining, L., Feneberg, M., Goldhahn, R., Schleife, A., Lambrecht, W.R.L., Gatti, M. "Author Correction: Delocalization of dark and bright excitons in flat-band materials and the optical properties of V2O5" npj Computational Materials., 10: art.n° 85. (2024).
Fantin, R., Van Roekeghem, A., Rueff, J.P., Benayad, A. "Surface analysis insight note: Accounting for X-ray beam damage effects in positive electrode-electrolyte interphase investigations" Surface and Interface Analysis., 56(6): 353-358. (2024).