Course to Advanced Techniques of Synchrotron radiation

Synchrotron SOLEIL and the French Vacuum Society (SFV) are happy to offer the fourth edition of this training. The previous three were highly successful indeed, with the participation of students, young researchers and academic research management, together with commercial innovation centres.

Objective

Where technological development is concerned, advanced methods for characterisation and analysis using synchrotron radiation have become indispensable for the gathering of structural, chemical, mechanical, electronic and magnetic information at the atomic and molecular scale for products and materials with a high value added.

This training, intended for a very varied public, is aimed at not only providing essential information for access to synchrotron radiation centres, but is also aimed at providing the knowledge necessary for use of the main techniques available in these facilities. Likewise the course provides the participants with a clear understanding of the criteria which determine effective selection of analysis methods. 

► More information about the site of the French Vacuum Society.

► Download the brochure in PDF format

Public concerned

• Higher level technicians, engineers, management staff, researchers and Phd students from both industrial and academic environments.
• Laboratories, R&D, production, control, technical support
• Sectors involved in characterisation of functional materials, classical materials, nanomaterials, corrosion and aging, plastics and composites, surface treatments, surface preparation and gluing, treatment of metals and alloys.

Programme

• Comparative presentation of the various techniques available in the synchrotron radiation centres and methods for characterisation available in conventional laboratories
• Preparation and handling of samples under vacuum, ion bombardment, annealing, evaporation, dosage, etc
• X-ray absorption spectroscopy (XAS) studies of various materials: semiconductors, insulators and metals. Elemental and chemical analysis (calibration, uncertainties and assignment of spectra)
• Spectroscopic analysis by photo-electron emission spectroscopy (PES) of materials of varying complexity (semiconductors, oxides and metals)
• Imaging of materials at different scales, from nanometre to millimetre using X-ray absorption contrast imaging
• Diffraction study for determination of the local order of various materials
• Acquisition and processing of data directly on a beamline of the SOLEIL Synchrotron

Training price

Member of SFV: 475 €

Non-member of SFV: 575 €

Registration

Please fill out the registration form and send it for the attention of Ms Christine LEMOINE by fax or email to the French Vacuum Society (SFV):

SFV - 19 rue du Renard - 75004 Paris  

Tél. : +33 (0)1 53 01 90 34 - Fax : +33 (0)1 42 78 63 20

christine.lemoine@vide.org

Another date

If you cannot attend this session, please be aware that there will be another taking place on December 4th, 2017.

Come to SOLEIL

address:

Société civile Synchrotron SOLEIL
L'Orme des Merisiers
Saint-Aubin - BP 48
91192 GIF-sur-YVETTE CEDEX

GPS coordinates:

Latitude: 48.7128003
Longitude:  2.1479529
On D128 crossroad, at the Orme des Merisiers