Aller au menu principal Aller au contenu principal

Publications

E.g., 18/11/2024
E.g., 18/11/2024
Dernière mise à jour : 05/10/2023
E.g., 18/11/2024
E.g., 18/11/2024
Mercère, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "Hartmann wavefront sensor and adaptive x-ray optics developments for synchrotron applications" Paper presented at the Adaptive X-Ray Optics, San Diego, California, USA, 3 August 2010. 7803: art.n° 780302. (2010).
Thomasset, M., Moreno, T., Capitanio, B., Idir, M., Bucourt, S. "In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation" Nuclear Instruments and Methods A., 616(2-3): 197-202. (2010).
Idir, M., Fricker, S., Modi, M.H., Potier, J. "X-ray digital wavefront sensor development" Nuclear Instruments and Methods A., 616(2-3): 255-260. (2010).
Idir, M., Mercère, P., Modi, M.H., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "X-ray active mirror coupled with a Hartmann Wavefront Sensor" Nuclear Instruments and Methods A., 616(2-3): 162-171. (2010).
Reverchon, J.L., Bansropun, S., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Duboz, J.Y., Giuliani, A., Idir, M. "Performances of AlGaN-based focal plane arrays from 10nm to 200nm" Paper presented at the Space Missions and Technologies, 5 April 2010, Orlando, Florida, USA. 7691: art.n° 769109. (2010).
Modi, M.H., Mercère, P., Idir, M. "High precision surface metrology using a phase retrieval method" Journal of Physics Conferences Series., 186: art.n° 012068. (2009).
Nagler, B., Zastrau, U., Fäustlin, R.R., Vinko, S.M., Whitcher, T., Nelson, A.J., Sobierajski, R., Krzywinski, J., Chalupsky, J., Abreu, E., Bajt, S., Bornath, T., Burian, T., Chapman, H., Cihelka, J., Döppner, T., Düsterer, S., Dzelzainis, T., Fajardo, M., Förster, E., Fortmann, C., Galtier, E., Glenzer, S.H., Göde, S., Gregori, G., Hajkova, V., Heimann, P., Juha, L., Jurek, M., Khattak, F.Y., Khorsand, A.R., Dorota Klinger, D., Kozlova, M., Laarmann, T., Lee, H.J., Lee, R.W., Meiwes-Broer, K.H., Mercère, P., Murphy, W.J., Przystawik, A., Redmer, R., Reinholz, H., Riley, D., Röpke, G., Rosmej, F., Saksl, K., Schott, R., Thiele, R., Tiggesbäumker, J., Toleikis, S., Tschentscher, T., Uschmann, I., Vollmer, H.J., Wark, J.S. "Turning solid aluminium transparent by intense soft X-ray photoionization" Nature Physics., 5(9): 693-696. (2009).
Reverchon, J.L., Bansropun, S., Robo, J.A., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Semond, F., Duboz, J.Y., Idir, M. "First demonstration and performances of AlGaN based focal plane array for deep-UV imaging" Proceedings of SPIE., 7474: FPA II -74741G. (2009).
Mercère, P., Bachelard, R., Couprie, M. E., Idir, M., Chubar, O., Gautier, J., Lambert, G., Zeitoun, P., Bucourt, S., Dovillaire, G., Levecq, X., Kimura, H., Ohashi, H., Hara, T., Higashiya, A., Ishikawa, T., Nagasono, M., Yabashi, M. "Spatial characterization of SASE-FEL of SCSS Test Accelerator" Paper presented at the 31st International FEL Conference, Liverpool (UK), August 23-28, 2009. abs.n° WEOD03. (2009).
Lee, R.W., Nagler, B., Zastrau, U., Fäustlin, R.R., Vinko, S.M., Whitcher, T., Sobierajski, R., Krzywinski, J., Juha, L., Nelson, A.J., Bajt, S., Budil, K., Cauble, R.C., Bornath, T., Burian, T., Chalupsky, J., Chapman, H., Cihelka, J., Döppner, T., Dzelzainis, T., Düsterer, S., Fajardo, M., Förster, E., Fortmann, C., Glenzer, S.H., Göde, S., Gregori, G., Hajkova, V., Heimann, P., Jurek, M., Khattak, F.Y., Khorsand, A.R., Klinger, D., Kozlova, M., Laarmann, T., Lee, H.J., Meiwes-Broer, K.H., Mercère, P., Murphy, W.J., Przystawik, A., Redmer, R., Reinholz, H., Riley, D., Röpke, G., Saksl, K., Thiele, R., Tiggesbäumker, J., Toleikis, S., Tschentscher, T., Uschmann, I., Falcone, R.W., Shepherd, R., Hastings, J.B., White, E., Wark, J.S. "Perspective for high energy density studies on x-ray FELs". Paper presented at the Soft X-Ray Lasers and Applications VIII, 04 August 2009, San Diego, CA, USA. 7451: 74510E. (2009).