Dernière mise à jour : 05/10/2023
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Richard, M.I., Fouet, J., Guichet, C., Mocuta, C., Thomas, O. "Exploring Pd-Si(001) and Pd-Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements" Thin Solid Films., 530: 100-104. (2013).
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